CUSTOMIZED & STANDARDIZED RETICLES / GRATICULES PATTTERNS
We are providing ultra high resolution patterns for your optical systems. Ultra Fine Pitch (Lines & Spaces) for alignment (Microscopy Magnification Calibration, Optical High Resolution Elements for Calibration, 2D or 3D imaging).
High precision scales for measurement and measuring angles.
Ultra Dense Grids for counting and referencing.
Contact us, we have cost-effective customized or standardized reticles for your application.